IEC/CDV 62228-2 Ed.1 Integrated circuit – EMC Evaluation of transceivers – Part 2: LIN transceivers
Committee: IEC/SC 47A
Comment Period Closes: 2015-10-20
This document specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for Standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).