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Showing items 44641 through 44650 of 51299.
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IEC 60749-18:2019
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)iec (not verified)
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IEC 60749-18:2019 RLV
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)iec (not verified)
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IEC 60749-18:2002
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)iec (not verified)
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IEC 60749-19:2003+AMD1:2010 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strengthiec (not verified)
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IEC 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strengthiec (not verified)
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IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: Generaliec (not verified)
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IEC 60749-20-1:2019 RLV
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heatiec (not verified)
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IEC 60749-20-1:2019
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heatiec (not verified)
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IEC 60749-20-1:2009
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heatiec (not verified)
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IEC 60749-20:2020 RLV
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heatiec (not verified)